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Figure 1. Square Loop Measurement of Chip Package Noise
Abstract: Voltage drops in chip packages can cause significantsignal integrity and EMC problems. The good news is that in many cases thesevoltages can be measured through mutual inductance. Measured results andtheir interpretation are discussed.
Figure 2 shows a pulse recorded from a package similar in appearance and size to the one shown in Figure 1. Theimpulse shown in Figure 2 was an isolated pulse with very low duty cycle.Notice the peak value of about 125 mV. If the coupling of the voltage dropin the package to the loop is 25% (a typical value) then the voltage dropin the package is about 500 mV! This is enough to be cause for concern andits effect on the signal integrity of the chip should be investigated asoutlined in the paper referenced above. In general, the effects on signalintegrity of a loop output of more than 50 mV should be investigated.
Conclusion: Useful information can be obtained from relativelysimple measurement techniques. The data above clearly shows detection ofpossible signal integrity and EMC problems in a chip package by just lookingat the output from a square loop held against the chip package.
References:
The data in the waveforms above was taken with an AgilentInfinium 54845a oscilloscope.
There is much that can be said about the above data andthis measurement technique that is not included here because of space limitations.More detailed information will be published on this topic and others in whitepapers on this website in the future. A demonstration of this effect has been recently added to my seminars.