Figure 1. Test Setup for Measuring ESD Current From an ESD Simulator
Abstract: IEC 61000-4-2, the
equipment level ESD testing standard, recently has been applied to
individual solid state devices, a controversial use of the standard and
despite there being no instructions in the standard on applying it to
individual devices. In addition, some buyers are also insisting on an
older 150 pF/150 Ohm network instead of the current 150 pF/330 Ohm
network. Waveforms are presented comparing the current discharge of
the two networks as supplied with a modern ESD simulator.
Discussion: Figure 1 shows the
overall test setup for measuring the current waveform. The simulator
ground lead was connected to the metal plane on the top of the table,
the Horizontal Coupling Plane of the IEC 61000-4-2 test (as opposed to
performing the test on the floor reference ground plane). The test was
done near the edge of the table so the waveforms will not be exactly
the same as the calibration waveforms, but a valid comparison of the
two networks can be made. This same configuration was used to test a
number of solid state devices. Current was measured with a Fischer F-65
current probe and Agilent 54845a oscilloscope.
Figure 2 shows a close-up of the measurement. The discharge tip of
the simulator easily fits through the F-65 current probe. I am holding
the current probe slightly off the ground plane so as to minimize
common mode ESD current from traveling down the coax shield to the
scope. There were several ferrite cores on the coax at the scope to
suppress common mode ESD currents as well. The coaxial
cable used was RG-142B/U. Its shielding effectiveness is extremely good
and RG142B/U coaxial cable is well suited for making ESD measurements with
the F-65 one GHz current probe.
Figure 2. Close-up of Current Measurement
Figure 3 shows the discharge current for a 1 kV contact discharge using
the 150 pF/330 Ohm network and Figure 4 shows the discharge current
with the 150 pF/150 Ohm network. There are both significant differences and similarities in the two waveforms.
Figure 3. Waveform for 150 pF/330 Ohm network
Figure 4.Waveform for 150 pF/150 Ohm network
Note that the that the initial current peak and its di/dt are about the
same for both waveforms at about 3 Amperes, but the slow part of the
waveform, current level lasting tens of nanoseconds, peaks at about 3
Amperes for the 150 Ohm network compared to about 2 Amperes for the 330
Ohm network. As expected, the 150 Ohm network delivers significantly
more energy to a device compared to the 330 Ohm network.
The "hash" starting about 7 ns before before the current
waveform is due to EMI from the ESD simulator and current discharge
radiating directly into the scope. The hash starts 7 ns earlier because
the air path to the scope has 7 ns less delay than the current waveform
traveling down the coaxial cable to the scope. This can be reduced to
insignificance by averaging several waveforms. An example of this
approach will be covered in next month's Technical Tidbit for December
2010.
Summary:
Comparison of the current discharge from both 150 pF/150 Ohm and 150
pF/330 Ohm networks in an ESD simulator shows that the 150 Ohm network
delivers significantly more current and energy to the device under test but that
the initial fast current peak is about the same in amplitude and di/dt.
I would like to thank
RMV Technology Group at NASA Ames Research Center for use of their facilities to generate the data for this Technical Tidbit.
Additional articles on this website related to this topic are:
- September 2004, Mobile Phone Response to EMI from Small Metal ESD
(for an example of ESD radiated noise into a scope measurement)
Equipment used in this Technical Tidbit:
- Teseq NSG 438 ESD Simulator (700K pdf file)
- Fischer Custom Communications F-65 Currrent Probe
- Agilent Infinium 54845a scope
I would like to thank
RMV Technology Group for the use of their facilities to perform the tests for this article.
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